Research Catalog

Stereology and quantitative metallography; a symposium presented at the seventy-fourth annual meeting, American Society for Testing and Materials, Atlantic City, N.J., 27 June-2 July, 1971.

Title
  1. Stereology and quantitative metallography; a symposium presented at the seventy-fourth annual meeting, American Society for Testing and Materials, Atlantic City, N.J., 27 June-2 July, 1971.
Published by
  1. Philadelphia, American Society for Testing Materials [1972]

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Details

Additional authors
  1. American Society for Testing and Materials. Subcommittee 11 on Electron Microscopy and Diffraction.
  2. American Society for Testing and Materials. Subcommittee 14 on Quantitative Metallography.
  3. American Society for Testing and Materials. Subcommittee 15 on Scanning Microscopy and Microprobe Analysis.
Description
  1. 182 p. illus.; 24 cm.
Series statement
  1. American Society for Testing and Materials. Special technical publication, \504
Uniform title
  1. ASTM special technical publication ; \504.
Subject
  1. Metallography > Congresses
  2. Stereology > Congresses
Call number
  1. VEE (American Society for Testing and Materials. Special technical publication. no. 504)
Note
  1. Sponsored by Subcommittee 11 on Electron Microscopy and Diffraction, Subcommittee 14 on Quantitative Metallography, and Subcommittee 15 on Scanning Microscopy and Microprobe Analysis of the American Society for Testing and Materials.
Bibliography (note)
  1. Includes bibliographical references.
Title
  1. Stereology and quantitative metallography; a symposium presented at the seventy-fourth annual meeting, American Society for Testing and Materials, Atlantic City, N.J., 27 June-2 July, 1971.
Imprint
  1. Philadelphia, American Society for Testing Materials [1972]
Series
  1. American Society for Testing and Materials. Special technical publication, \504
  2. ASTM special technical publication ; \504.
Bibliography
  1. Includes bibliographical references.
Added author
  1. American Society for Testing and Materials. Subcommittee 11 on Electron Microscopy and Diffraction.
  2. American Society for Testing and Materials. Subcommittee 14 on Quantitative Metallography.
  3. American Society for Testing and Materials. Subcommittee 15 on Scanning Microscopy and Microprobe Analysis.
LCCN
  1. 79186851
Research call number
  1. VEE (American Society for Testing and Materials. Special technical publication. no. 504)
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