Research Catalog

Details

Additional authors

1. IEEE Computer Society. Test Technology Committee.
2. Institute of Electrical and Electronics Engineers. Philadelphia Section.

Description

1. xxv, 806 p. : ill.; 28 cm.

Alternative title

1. International Test Conference 1983 proceedings.

Subject

1. Automatic test equipment > Congresses
2. Electronic digital computers > Circuits > Testing > Congresses
3. Integrated circuits > Testing > Congresses

Call number

1. JSF 84-138

Note

1. Spine title: International Test Conference 1983 proceedings.
2. "IEEE catalog no. 83CH1933-1."
3. "Computer Society order no. 502."

Bibliography (note)

1. Includes bibliographical references and index.

Conference

1. International Test Conference (14th : 1983 : Philadelphia, Pa.)

Title

1. Testing's changing role : International Test Conference, 1983 : proceedings, October 18-20, 1983 / sponsored by the IEEE Computer Society, Test Technology Committee, IEEE Philadelphia Section.

Imprint

1. Silver Spring, MD : IEEE Computer Society Press, 1983.

Bibliography

1. Includes bibliographical references and index.

Added author

1. IEEE Computer Society. Test Technology Committee.
2. Institute of Electrical and Electronics Engineers. Philadelphia Section.

Added title

1. International Test Conference 1983 proceedings.

LCCN

1. 83081805

ISBN

1. 0818605022 (pbk.)

Research call number

1. JSF 84-138