Research Catalog

Proceedings IEEE 1985 Workshop on Simulation & Test Generation Environments : September 17 & 18, 1985, San Francisco, California ; sponsors

Title
  1. Proceedings IEEE 1985 Workshop on Simulation & Test Generation Environments : September 17 & 18, 1985, San Francisco, California ; sponsors / IEEE Computer Society [and] Test Technology Committee.
Published by
  1. Washington, D.C. : IEEE Computer Society Press ; Los Angeles, CA : Order from IEEE Computer Society, c1986.
Author
  1. IEEE Workshop on Simulation & Test Generation Environments (1985 : San Francisco, Calif.)

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Details

Additional authors
  1. IEEE Computer Society.
  2. IEEE Computer Society. Test Technology Committee.
Description
  1. vii, 179 p. : ill.; 28 cm.
Subject
  1. Integrated circuits > Testing > Congresses
  2. Automatic test equipment > Congresses
Call number
  1. JSF 86-900
Note
  1. "IEEE Computer Society order number 732."
  2. "IEEE catalog number 86CH2296-2."
  3. Title on cover and spine: 1985/1986 Workshop on Simulation and test Generation Environment.
Bibliography (note)
  1. Includes bibliographies and index.
Conference
  1. IEEE Workshop on Simulation & Test Generation Environments (1985 : San Francisco, Calif.)
Title
  1. Proceedings IEEE 1985 Workshop on Simulation & Test Generation Environments : September 17 & 18, 1985, San Francisco, California ; sponsors / IEEE Computer Society [and] Test Technology Committee.
Imprint
  1. Washington, D.C. : IEEE Computer Society Press ; Los Angeles, CA : Order from IEEE Computer Society, c1986.
Bibliography
  1. Includes bibliographies and index.
Added author
  1. IEEE Computer Society.
  2. IEEE Computer Society. Test Technology Committee.
LCCN
  1. 86080457
ISBN
  1. 0818607327 (pbk.)
  2. 0818687320 (hard)
  3. 0818647329 (microfiche)
Research call number
  1. JSF 86-900
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