Proceedings IEEE 1985 Workshop on Simulation & Test Generation Environments : September 17 & 18, 1985, San Francisco, California ; sponsors
- Title
- Proceedings IEEE 1985 Workshop on Simulation & Test Generation Environments : September 17 & 18, 1985, San Francisco, California ; sponsors / IEEE Computer Society [and] Test Technology Committee.
- Published by
- Washington, D.C. : IEEE Computer Society Press ; Los Angeles, CA : Order from IEEE Computer Society, c1986.
- Author
Items in the library and off-site
Displaying 1 item
Status | Format | Access | Call number | Item location |
---|---|---|---|---|
Status | FormatText | AccessRequest in advance | Call numberJSF 86-900 | Item locationOffsite |
Details
- Additional authors
- Description
- vii, 179 p. : ill.; 28 cm.
- Subject
- Call number
- JSF 86-900
- Note
- "IEEE Computer Society order number 732."
- "IEEE catalog number 86CH2296-2."
- Title on cover and spine: 1985/1986 Workshop on Simulation and test Generation Environment.
- Bibliography (note)
- Includes bibliographies and index.
- Conference
- IEEE Workshop on Simulation & Test Generation Environments (1985 : San Francisco, Calif.)
- Title
- Proceedings IEEE 1985 Workshop on Simulation & Test Generation Environments : September 17 & 18, 1985, San Francisco, California ; sponsors / IEEE Computer Society [and] Test Technology Committee.
- Imprint
- Washington, D.C. : IEEE Computer Society Press ; Los Angeles, CA : Order from IEEE Computer Society, c1986.
- Bibliography
- Includes bibliographies and index.
- Added author
- IEEE Computer Society.
- IEEE Computer Society. Test Technology Committee.
- LCCN
- 86080457
- ISBN
- 0818607327 (pbk.)
- 0818687320 (hard)
- 0818647329 (microfiche)
- Research call number
- JSF 86-900