Research Catalog

Details

Additional authors

1. Schnabel, C. M.
2. NASA Glenn Research Center.

Description

1. 1 v.

Series statement

1. [NASA technical memorandum] ; NASA/TM-2000-209648

Uniform title

1. NASA technical memorandum ; 209648.

Subject

1. Crystal defects
2. Schottky diodes
3. Electron beams
4. Beam currents
5. Topography
6. Synchrotrons
7. Correlation

Call number

1. READEX Microfiche NAS 1.15:209648

Note

1. Shipping list no.: 2000-0603-M.

Reproduction (note)

1. Microfiche.

Title

1. Correlation of EBIC and SWBXT imaged defects and epilayer growth pits in 6H-SiC Schottky diodes [microform] / C.M. Schnabel ... [et al.].

Imprint

1. [Cleveland, Ohio] : National Aeronautics and Space Administration, Glenn Research Center ; [Springfield, Va. : National Technical Information Service, distributor, 2000]

Series

1. [NASA technical memorandum] ; NASA/TM-2000-209648
2. NASA technical memorandum ; 209648.

Reproduction

1. Microfiche. [Washington, D.C. : National Aeronautics and Space Administration, 2000] 1 microfiche.

Added author

1. Schnabel, C. M.
2. NASA Glenn Research Center.

Gpo item no.

1. 0830-D (MF)

Sudoc no.

1. NAS 1.15:209648

Research call number

1. READEX Microfiche NAS 1.15:209648