Research Catalog

Details

Additional authors

1. Roth, Don J.
2. United States. National Aeronautics and Space Administration. Scientific and Technical Information Program.

Description

1. 1 v.

Series statement

1. NASA technical paper ; 3377

Subject

1. Silicon nitride

Call number

1. READEX Microfiche NAS 1.60:3377

Note

1. Distributed to depository libraries in microfiche.
2. Shipping list no.: 94-0014-M.

Reproduction (note)

1. Microfiche.

Title

1. Quantitative mapping of pore fraction variations in silicon nitride using an ultrasonic contact scan technique [microform] / Don J. Roth ... [et al.].

Imprint

1. [Washington, DC] : National Aeronautics and Space Administration, Office of Management, Scientific and Technical Information Program ; [Springfield, Va. : National Technical Information Service, distributor], 1993.

Series

1. NASA technical paper ; 3377

Reproduction

1. Microfiche. [Washington, D.C. : National Aeronautics and Space Administration, 1993] 1 microfiche.

Added author

1. Roth, Don J.
2. United States. National Aeronautics and Space Administration. Scientific and Technical Information Program.

Gpo item no.

1. 0830-H-15 (MF)

Sudoc no.

1. NAS 1.60:3377

Research call number

1. READEX Microfiche NAS 1.60:3377