Research Catalog

X-ray diffraction imaging (topography) of electrooptic crystals by synchrotron radiation

Title
  1. X-ray diffraction imaging (topography) of electrooptic crystals by synchrotron radiation [microform] / Bruce Steiner ... [et al.].
Published by
  1. [Washington, DC : National Aeronautics and Space Administration ; Springfield, Va. : National Technical Information Service, distributor, 1988]

Details

Additional authors
  1. Steiner, Bruce.
  2. United States. National Aeronautics and Space Administration.
Description
  1. 1 v.
Series statement
  1. NASA contractor report ; NASA CR-183266
Subject
  1. X-rays > Diffraction
  2. Imaging systems in astronomy
  3. Synchrotron radiation
Call number
  1. READEX Microfiche NAS 1.26:183266
Note
  1. Distributed to depository libraries in microfiche.
Reproduction (note)
  1. Microfiche.
Title
  1. X-ray diffraction imaging (topography) of electrooptic crystals by synchrotron radiation [microform] / Bruce Steiner ... [et al.].
Imprint
  1. [Washington, DC : National Aeronautics and Space Administration ; Springfield, Va. : National Technical Information Service, distributor, 1988]
Series
  1. NASA contractor report ; NASA CR-183266
Reproduction
  1. Microfiche. [Washington, D.C. : National Aeronautics and Space Administration, 1988] 1 microfiche.
Added author
  1. Steiner, Bruce.
  2. United States. National Aeronautics and Space Administration.
Gpo item no.
  1. 0830-H-14 (MF)
Sudoc no.
  1. NAS 1.26:183266
Research call number
  1. READEX Microfiche NAS 1.26:183266
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