X-ray diffraction imaging (topography) of electrooptic crystals by synchrotron radiation
- Title
- X-ray diffraction imaging (topography) of electrooptic crystals by synchrotron radiation [microform] / Bruce Steiner ... [et al.].
- Published by
- [Washington, DC : National Aeronautics and Space Administration ; Springfield, Va. : National Technical Information Service, distributor, 1988]
Details
- Additional authors
- Steiner, Bruce.
- United States. National Aeronautics and Space Administration.
- Description
- 1 v.
- Series statement
- NASA contractor report ; NASA CR-183266
- Subject
- X-rays > Diffraction
- Imaging systems in astronomy
- Synchrotron radiation
- Call number
- READEX Microfiche NAS 1.26:183266
- Note
- Distributed to depository libraries in microfiche.
- Reproduction (note)
- Microfiche.
- Title
- X-ray diffraction imaging (topography) of electrooptic crystals by synchrotron radiation [microform] / Bruce Steiner ... [et al.].
- Imprint
- [Washington, DC : National Aeronautics and Space Administration ; Springfield, Va. : National Technical Information Service, distributor, 1988]
- Series
- NASA contractor report ; NASA CR-183266
- Reproduction
- Microfiche. [Washington, D.C. : National Aeronautics and Space Administration, 1988] 1 microfiche.
- Added author
- Steiner, Bruce.
- United States. National Aeronautics and Space Administration.
- Gpo item no.
- 0830-H-14 (MF)
- Sudoc no.
- NAS 1.26:183266
- Research call number
- READEX Microfiche NAS 1.26:183266
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