The Georgia Tech high sensitivity microwave measurement system

Title
  1. The Georgia Tech high sensitivity microwave measurement system [microform] / David R. Deboer and Paul G. Steffes.
Published by
  1. [Washington, DC : National Aeronautics and Space Administration ; Springfield, Va. : National Technical Information Service, distributor, 1996]
Author
  1. Deboer, David R.

Details

Additional authors
  1. Steffes, Paul G.
  2. United States. National Aeronautics and Space Administration.
Description
  1. 1 v.
Series statement
  1. [NASA contractor report] ; CR-205257
Uniform title
  1. NASA contractor report ; NASA CR-205257.
Subject
  1. Microwaves
  2. Planets
  3. Refractivity
  4. Planetary atmospheres
  5. Measuring instruments
  6. Absorptivity
Call number
  1. READEX Microfiche NAS 1.26:205257
Note
  1. Shipping list no.: 98-0949-M.
Reproduction (note)
  1. Microfiche.
Author
  1. Deboer, David R.
Title
  1. The Georgia Tech high sensitivity microwave measurement system [microform] / David R. Deboer and Paul G. Steffes.
Imprint
  1. [Washington, DC : National Aeronautics and Space Administration ; Springfield, Va. : National Technical Information Service, distributor, 1996]
Series
  1. [NASA contractor report] ; CR-205257
  2. NASA contractor report ; NASA CR-205257.
Reproduction
  1. Microfiche. [Washington, D.C. : National Aeronautics and Space Administration, 1997] 1 microfiche.
Added author
  1. Steffes, Paul G.
  2. United States. National Aeronautics and Space Administration.
Gpo item no.
  1. 0830-H-14 (MF)
Sudoc no.
  1. NAS 1.26:205257
Research call number
  1. READEX Microfiche NAS 1.26:205257
View in legacy catalog