Research Catalog

Stress-induced phenomena in metallization : Sixth International Workshop on Stress-Induced Phenomena in Metallization, Ithaca, New York, 25-27 July 2001

Title
  1. Stress-induced phenomena in metallization : Sixth International Workshop on Stress-Induced Phenomena in Metallization, Ithaca, New York, 25-27 July 2001 / editors, Shefford P. Baker ... [et al.].
Published by
  1. Melville, N.Y. : American Institute of Physics, 2002.
Author
  1. International Workshop on Stress-Induced Phenomena in Metallization (6th : 2001 : Ithaca, N.Y.)

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Details

Additional authors
  1. Baker, Shefford P.
Description
  1. ix, 250 p. : ill.; 25 cm.
Series statement
  1. AIP conference proceedings, 0094-243X ; v. 612
Uniform title
  1. AIP conference proceedings ; no. 612.
Subject
  1. Aluminum films > Congresses
  2. Semiconductors > Defects > Congresses
  3. Thin film devices > Defects > Congresses
  4. Metallic films > Congresses
  5. Metallizing > Congresses
Call number
  1. JSE 02-1161
Bibliography (note)
  1. Includes bibliographical references and indexes.
Conference
  1. International Workshop on Stress-Induced Phenomena in Metallization (6th : 2001 : Ithaca, N.Y.)
Title
  1. Stress-induced phenomena in metallization : Sixth International Workshop on Stress-Induced Phenomena in Metallization, Ithaca, New York, 25-27 July 2001 / editors, Shefford P. Baker ... [et al.].
Imprint
  1. Melville, N.Y. : American Institute of Physics, 2002.
Series
  1. AIP conference proceedings, 0094-243X ; v. 612
  2. AIP conference proceedings ; no. 612.
Bibliography
  1. Includes bibliographical references and indexes.
Added author
  1. Baker, Shefford P.
LCCN
  1. 2002102851
ISBN
  1. 073540058X
Research call number
  1. JSE 02-1161
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