Research Catalog

Details

Additional authors

1. Kiser, James D.
2. Roth, Don J.
3. United States. National Aeronautics and Space Administration.

Description

1. 1 v.

Series statement

1. NASA technical memorandum ; 86945

Uniform title

1. NASA technical memorandum ; 86945.

Subject

1. Detection
2. Radiography
3. Reaction bonding
4. Sensitivity
5. Silicon carbides
6. Silicon nitrides

Call number

1. GPO Microfiche NAS 1.15:86945

Reproduction (note)

1. Microfiche.

Author

1. Baaklini, George Y.

Title

1. Radiographic detectability limits for seeded voids in sintered silicon carbide and silicon nitride [microform] / George Y. Baaklini, James D. Kiser, and Don J. Roth.

Imprint

1. [Washington, D.C.] : National Aeronautics and Space Administration, [1985]

Series

1. NASA technical memorandum ; 86945
2. NASA technical memorandum ; 86945.

Reproduction

1. Microfiche. [Washington, D.C. : National Aeronautics and Space Administration], 1985. 1 microfiche.

Added author

1. Kiser, James D.
2. Roth, Don J.
3. United States. National Aeronautics and Space Administration.

Gpo item no.

1. 0830-D (MF)

Sudoc no.

1. NAS 1.15:86945

Research call number

1. GPO Microfiche NAS 1.15:86945