Research Catalog

X-ray/EUV optics for astronomy, microscopy, polarimetry, and projection lithography : proceedings : 9-13 July 1990, San Diego, California

Title
  1. X-ray/EUV optics for astronomy, microscopy, polarimetry, and projection lithography : proceedings : 9-13 July 1990, San Diego, California / Richard B. Hoover, Arthur B.C. Walker, Jr., chairs/editors : sponsored by SPIE--the International Society for Optical Engineering.
Published by
  1. Bellingham, Wash., USA : SPIE--the International Society for Optical Engineering, [1991], ©1991.

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Details

Additional authors
  1. Hoover, Richard B.
  2. Walker, A. B. C.
  3. Society of Photo-optical Instrumentation Engineers.
  4. International Symposium on Optical and Optoelectronic Applied Sciences and Engineering (1990 : San Diego, Calif.)
Description
  1. xii, 579 pages : illustrations; 28 cm.
Series statement
  1. SPIE proceedings series, 0277-786X ; vol. 1343
Uniform title
  1. Proceedings of SPIE--the International Society for Optical Engineering ; v. 1343.
Subject
  1. X-ray astronomy > Congresses
  2. X-ray microscopes > Congresses
  3. Optical images > Congresses
Note
  1. "Conference 1343 ... held at SPIE's International Symposium on Optical and Optoelectronic Applied Science and Engineering"--P. x.
Bibliography (note)
  1. Includes bibliographical references and index.