Electron-beam, X-ray, EUV, and ion-beam submicrometer lithographies for manufacturing V : 20-21 February 1995, Santa Clara, California /

Title
  1. Electron-beam, X-ray, EUV, and ion-beam submicrometer lithographies for manufacturing V : 20-21 February 1995, Santa Clara, California / John M. Warlaumont, chair/editor ; sponsored and published by SPIE--the International Society for Optical Engineering : cooperating organization SEMI--Semiconductor Equipment and Materials International.
Published by
  1. Bellingham, Wash., USA : SPIE, c1995.

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Additional authors
  1. Semiconductor Equipment and Materials International. http://id.loc.gov/authorities/names/n90682619
  2. Society of Photo-optical Instrumentation Engineers. http://id.loc.gov/authorities/names/n78088934
  3. Warlaumont, John M.
Description
  1. vii, 450 p. : ill.; 28 cm.
Series statement
  1. SPIE proceedings series, 0277-786X ; vol. 2437
Uniform title
  1. Proceedings of SPIE--the International Society for Optical Engineering ; v. 2437.
Subject
  1. X-ray lithography > Congresses
  2. Ion beam lithography > Congresses
  3. Lithography, Electron beam > Congresses
Owning institution
  1. Princeton University Library
Bibliography (note)
  1. Includes bibliographical references and index.