Research Catalog

Trace characterization, chemical and physical

Title
  1. Trace characterization, chemical and physical / W. Wayne Meinke and Bourdon F. Scribner, editors, Institute for Materials Research.
Published by
  1. Washington D.C. : Dept. of Commerce, National Bureau of Standards, 1967.
Author
  1. Materials Research Symposium (1st : 1966 : Gaithersburg, Md.)

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Details

Additional authors
  1. Meinke, W. Wayne
  2. Scribner, Bourdon F. (Bourdon Francis), 1910-2007
  3. Institute for Materials Research (U.S.)
Description
  1. xiii, 580 pages : illustrations; 25 cm.
Summary
  1. A symposium on Trace Characterization, Chemical and Physical was held at the National Bureau of Standards October 3-7, 1966.The volume contains the texts of invited lectures, and summaries by the rapporteurs of the contributed papers and discussion sessions.Topics covered include trace characterization and the properties of materials; electrical measurements; electrochemical methods; optical and x-ray spectroscopy; x-ray diffraction; optical methods; chemical spectrophotometry; nuclear methods; mass spectroscopy; preconcentration; sampling and reagents; and electron and optical microscopy.(Author).
Series statement
  1. National Bureau of Standards monograph ; 100
Uniform title
  1. NBS monograph ; 100.
Subject
  1. Analytical chemistry > Congresses
  2. Chimie
  3. Congrè€s
  4. Analytical chemistry
  5. Chimie analytique
Genre/Form
  1. Conference papers and proceedings
  2. Technical reports.
  3. Conference papers and proceedings.
Contents
  1. Trace characterization and the properties of materials / Hannay, N.B. -- Electrical measurements for trace characterization / Weisberg, L.R. -- Trace characterization by electrochemical methods / Laitinen, H.A. -- Optical and x-ray spectroscopy / Addink, N.W.H. -- Effects of trace impurities on x-ray diffraction / Chikawa, J, and Newkirk, J.B. -- Chemical spectrophotometry in trace characterization / West, T.S. -- Radioactivity techniques in trace characterization / Smales, A.A. -- Spark source mass spectrometric analysis of solids / Ahearn, A.J. -- Preconcentration in trace analysis / Minczewski, J. -- The study of crystal imperfections by means of optical methods and by means of electron microscopy and electron diffraction / Amelinckx, S.
Owning institution
  1. Princeton University Library
Note
  1. "Based on lectures and discussions of the 1st Materials Research Symposium held at the NBS, Gaithersburg, Maryland, October 3-7, 1966."
Bibliography (note)
  1. Includes bibliographies.
Additional formats (note)
  1. Also available in an electronic version.