Diffraction and imaging techniques in material science

Title
  1. Diffraction and imaging techniques in material science / editors, S. Amelinckx, R. Gevers, J. Van Landuyt.
Published by
  1. Amsterdam ; New York : North-Holland Pub. Co. : Sole distributors for the U.S.A. and Canada, Elsevier North-Holland, 1978.

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StatusVol/datevol.2FormatTextAccessUse in libraryCall numberTA417.23 .D54 1978 vol.2Item locationOff-site
StatusVol/datevol.1FormatTextAccessUse in libraryCall numberTA417.23 .D54 1978 vol.1Item locationOff-site

Details

Additional authors
  1. Amelinckx, S. (Severin)
  2. Gevers, R.
  3. Landuyt, J. van.
  4. International Summer Course on Material Science (1969 : Antwerp, Belgium). Modern diffraction and imaging techniques in material science.
Description
  1. 2 volumes (xvii, 847 pages, [1] folded leaf of plates) : illustrations; 23 cm
Subject
  1. Electron microscopy > Congresses
  2. Electrons > Diffraction > Congresses
  3. Imaging systems > Congresses
  4. Electron microscopy
  5. Electrons > Diffraction
  6. Imaging systems
  7. Elektronenmicroscopie
  8. Afbeeldingen (algemeen)
  9. MICROSCÓPIO ELETRÔNICO (CONGRESSOS)
Genre/Form
  1. Conference papers and proceedings
Contents
  1. v. 1. Electron microscopy.--v. 2. Imaging and diffraction techniques.
Owning institution
  1. Princeton University Library
Note
  1. Comprises new contributions and revised and updated papers originally presented at the International Summer Course on Material Science, Antwerp, 1969, and published in 1970 under title: Modern diffraction and imaging techniques in material science.
Bibliography (note)
  1. Includes bibliographical references and index.