Research Catalog

LSI/VLSI testability design

Title
  1. LSI/VLSI testability design / Frank F. Tsui.
Published by
  1. New York : McGraw-Hill, ©1987.
Author
  1. Tsui, Frank F.

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FormatTextAccessUse in libraryCall numberTK7874 .T78 1987Item locationOff-site

Details

Description
  1. xv, 702 pages : illustrations; 24 cm
Subject
  1. Integrated circuits > Large scale integration > Testing
  2. Integrated circuits > Very large scale integration > Testing
  3. Integrated circuits > Large scale integration > Testing
  4. Integrated circuits > Very large scale integration > Testing
  5. Entwurf
  6. Integrierte Schaltung
  7. Prüftechnik
Owning institution
  1. Princeton University Library
Note
  1. Includes index.
Bibliography (note)
  1. Bibliography: p. 585-684.