Research Catalog

Details

Additional authors

1. Grover, C. P.
2. Society of Photo-optical Instrumentation Engineers.
3. International Symposium on Optical & Optoelectronic Applied Science & Engineering (1990 : San Diego, Calif.)

Description

1. 2 volumes (xii, 886 pages) : illustrations; 28 cm.

Series statement

1. SPIE proceedings series ; v. 1332

Uniform title

1. Proceedings of SPIE--the International Society for Optical Engineering ; v. 1332.

Alternative title

1. Optical testing and metrology 3.
2. Optical testing and metrology three
3. Recent advances in industrial optical inspection
4. Industrial optical inspection
5. Optical design and fabrication.

Subject

1. Optical measurements > Congresses
2. Quality control > Optical methods > Congresses
3. Measurement > Congresses
4. Measurement
5. Optical measurements
6. Quality control > Optical methods

Genre/Form

1. Conference papers and proceedings.

Contents

1. pt. 1. Testing of optical components and systems ; Testing of aspheric and generalized surfaces ; Holography and holographic interferometry ; Holography and phase conjugation ; Image metrology and 3-D vision ; Fiber optic and laser sensing -- pt. 2. Optical profiling of surface microtopography ; Submicron distance metrology ; Novel interferometric metrology devices ; Fringe analysis and phase measurement ; Specialized techniques and applications.

Note

1. "Conference 1332 ... was part of a six-conference program on Optical Design and Fabrication held at SPIE's International Symposium on Optical and Optoelectronic Applied Science and Engineering, 8-13 July 1990, San Diego, California"--P. x.

Bibliography (note)

1. Includes bibliographical references and index.