Critical phenomena at surfaces and interfaces : evanescent X-ray and neutron scattering
- Title
- Critical phenomena at surfaces and interfaces : evanescent X-ray and neutron scattering / Helmut Dosch.
- Published by
- Berlin ; New York : Springer-Verlag, ©1992.
- Author
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Displaying 1 item
Status | Format | Access | Call number | Item location |
---|---|---|---|---|
Status | FormatText | AccessUse in library | Call numberQ111 .E7 vol.126 | Item locationOff-site |
Details
- Description
- x, 145 pages : illustrations; 25 cm.
- Series statement
- Springer tracts in modern physics ; 126
- Uniform title
- Springer tracts in modern physics ; 126.
- Subject
- Surfaces (Physics) > Optical properties
- Critical phenomena (Physics)
- X-rays > Scattering
- Neutrons > Scattering
- Grazing incidence
- x-ray scattering
- Festkörperoberfläche
- Kritische magnetische Neutronenstreuung
- Kritisches Phänomen
- Neutronenstrahlung
- Neutronenstreuung
- Röntgenstrahlung
- Röntgenstreuung
- Streifender Einfall
- Totalreflexion
- Phénomènes critiques (physique)
- Surfaces (physique) > Propriétés optiques
- Neutrons > Diffusion
- Interfaces (sciences physiques)
- Rayons X > Diffusion
- Incidence rasante
- Owning institution
- Princeton University Library
- Bibliography (note)
- Includes bibliographical references and index.
- Additional formats (note)
- Also available in an electronic version.