Research Catalog

Critical phenomena at surfaces and interfaces : evanescent X-ray and neutron scattering

Title
  1. Critical phenomena at surfaces and interfaces : evanescent X-ray and neutron scattering / Helmut Dosch.
Published by
  1. Berlin ; New York : Springer-Verlag, ©1992.
Author
  1. Dosch, Helmut, 1955-

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FormatTextAccessUse in libraryCall numberQ111 .E7 vol.126Item locationOff-site

Details

Description
  1. x, 145 pages : illustrations; 25 cm.
Series statement
  1. Springer tracts in modern physics ; 126
Uniform title
  1. Springer tracts in modern physics ; 126.
Subject
  1. Surfaces (Physics) > Optical properties
  2. Critical phenomena (Physics)
  3. X-rays > Scattering
  4. Neutrons > Scattering
  5. Grazing incidence
  6. x-ray scattering
  7. Festkörperoberfläche
  8. Kritische magnetische Neutronenstreuung
  9. Kritisches Phänomen
  10. Neutronenstrahlung
  11. Neutronenstreuung
  12. Röntgenstrahlung
  13. Röntgenstreuung
  14. Streifender Einfall
  15. Totalreflexion
  16. Phénomènes critiques (physique)
  17. Surfaces (physique) > Propriétés optiques
  18. Neutrons > Diffusion
  19. Interfaces (sciences physiques)
  20. Rayons X > Diffusion
  21. Incidence rasante
Owning institution
  1. Princeton University Library
Bibliography (note)
  1. Includes bibliographical references and index.
Additional formats (note)
  1. Also available in an electronic version.