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Conference record, IEEE Instrumentation and Measurement Conference : March 25-27, 1986, University of Colorado Events/Conference Center, Hilton Harvest House Hotel, Boulder, Colorado, USA.

Text

New York, NY : Institute of Electrical and Electronics Engineers ; Piscataway, NJ : IEEE Service Center, 1986.

1986

1 item

FormatCall numberItem location
FormatTextCall numberJSF 86-1038Item locationOffsite

IEEE Instrumentation and Measurement Technology Conference, April 20-22, 1988, San Diego Princess Hotel, San Diego, California.

Text

New York, N.Y. : Institute of Electrical and Electronics Engineers ; Piscataway, N.J. : Additional copies from IEEE Service Center, c1988.

1988

1 item

FormatCall numberItem location
FormatTextCall numberJSF 88-1544Item locationOffsite

Conference record : IMTC/93, Hyatt Regency Hotel Irvine, Orange County, California, May 18-20, 1993 / IEEE Instrumentation and Measurement Technology Conference.

Text

[New York, N.Y.] : IEEE ; Piscataway, NJ, USA : Additional copies may be ordered from IEEE Service Center, c1993.

1993

1 item

FormatCall numberItem location
FormatTextCall numberJSF 93-850Item locationOffsite

IEEE transactions on instrumentation and measurement.

Text

New York, Institute of Electrical and Electronics Engineers.

1963-present

39 items

FormatCall numberItem location
FormatTextCall numberJSM 94-405 v. 57, no. 3 (Mar. 2008)Item locationOffsite
FormatCall numberItem location
FormatTextCall numberJSM 94-405 v. 57, no. 2 (Feb. 2008)Item locationOffsite
FormatCall numberItem location
FormatTextCall numberJSM 94-405 v. 57, no. 1 (Jan. 2008)Item locationOffsite

IMTC proceedings : IMTC/97 IEEE Instrumentation & Measurement Technology Conference : sensing, processing, networking, Hotel Château Laurier, Ottawa, Canada, May 19-21, 1997 / sponsors, IEEE Instrumentation and Measurement Society, IEEE Ottawa Section.

Text

[New York] : Institute of Electrical and Electronics Engineers ; Piscataway, N.J. : IEEE Service Center, c1997.

1997

2 items

FormatCall numberItem location
FormatTextCall numberJSF 97-393 v. 2Item locationOffsite
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FormatTextCall numberJSF 97-393 v. 1Item locationOffsite

Conference proceedings : IMTC/98, IEEE Instrumentation and Measurement Technology Conference : where instrumentation is going, The Saint Paul Hotel, St. Paul, Minnesota USA, May 18-21, 1998 / sponsors: IEEE Instrumentation and Measurement Society, IEEE Twin Cities Section.

Text

[New York, N.Y.] : Institute of Electrical and Electronics Engineers ; Piscataway, N.J. : IEEE Service Center, c1998.

1998

2 items

FormatCall numberItem location
FormatTextCall numberJSF 98-373 v. 2Item locationOffsite
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FormatTextCall numberJSF 98-373 v. 1Item locationOffsite

IMTC/99 : Proceedings of the 16th IEEE Instrumentation and Measurement Technology Conference : Measurements for the New Millennium, Venice, Italy, May 24-26, 1999 / Organized and sponsored by the IEEE Instrumentation and Measurement Society, [et. al], edited by Vincenzo Piuri and Mario Savino.

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[New York, N.Y.] : Institute of Electrical and Electronics Engineers ; Piscataway, N.J. : IEEE Service Center, c1999.

1999

3 items

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FormatTextCall numberJSF 99-696 v. 3Item locationOffsite
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FormatTextCall numberJSF 99-696 v. 2Item locationOffsite
FormatCall numberItem location
FormatTextCall numberJSF 99-696 v. 1Item locationOffsite

Proceedings of the ... IEEE Instrumentation and Measurement Technology Conference / IMTC.

Text

[New York, N.Y.?] : IEEE, c1999-

1999-present

2 items

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FormatTextCall numberJSM 07-67 2005:v. 2Item locationOffsite
FormatCall numberItem location
FormatTextCall numberJSM 07-67 2005:v. 1Item locationOffsite

Digest / organized by National Institute of Standards and Technology.

Text

[New York] : Institute of Electrical and Electronics Engineers.

200-2000

5 items

FormatCall numberItem location
FormatTextCall numberJSP 81-165 2000Item locationOffsite
FormatCall numberItem location
FormatTextCall numberJSP 81-165 1998Item locationOffsite
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FormatTextCall numberJSP 81-165 1996Item locationOffsite

IMTC '85 proceedings / IEEE Instrumentation and Measurement Technology Conference, March 20-22, 1985, Hyatt Regency Hotel, Tampa, FL.

Text

New York, NY : Institute of Electrical and Electronics Engineers ; Piscataway, NJ : Order from IEEE Service Center, c1985.

1985

1 item

FormatCall numberItem location
FormatTextCall numberJSF 11-9Item locationOffsite

Symposium proceedings / Autotestcon.

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New York, NY : Institute of Electrical and Electronics Engineers, [1988], ©1988.

1988-1988

1 item

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FormatTextCall numberTJ213 .A841 1988Item locationOff-site

Conference record / Autotestcon.

Text

New York, NY : IEEE, ©1989-

1989-1992

3 items

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FormatTextCall numberTJ213 .A841 1989Item locationOff-site
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FormatTextCall numberTJ213 .A841 1990Item locationOff-site
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FormatTextCall numberTJ213 .A841 1991Item locationOff-site

Conference record : Autotestcon '96 : test technology and commercialization, September 16-19, 1996, Dayton, Ohio / sponsored by The Institute of Electrical & Electronics Engineers, Aerospace and Electronics Systems Society, Instrumentation and Measurement Society.

Text

[New York, N.Y.] : Institute of Electrical and Electronics Engineers ; Piscataway, N.J. : IEEE Service Center, [1996], ©1996.

1996-1996

1 item

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FormatTextCall numberTK7895.A8 A98 1996gItem locationOff-site

IEEE transactions on instrumentation and measurement.

Text

New York, Institute of Electrical and Electronics Engineers [etc.]

1952-present

42 items

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FormatTextCall numberTK7800.In75 IM v.55:no.1-3 (2006)Item locationOff-site
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FormatTextCall numberTK7800.In75 IM v.55:no.4-6 (2006)Item locationOff-site
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FormatTextCall numberTK7800.In75 IM v.54:no.1-3 (2005)Item locationOff-site

IEEE instrumentation & measurement magazine.

Text

New York, NY : Institute of Electrical and Electronics Engineers, ©1998-

1998-present

8 items

FormatCall numberItem location
FormatTextCall numberTK7869 .I35 v.9 (2006)Item locationOff-site
FormatCall numberItem location
FormatTextCall numberTK7869 .I35 v.8 (2005)Item locationOff-site
FormatCall numberItem location
FormatTextCall numberTK7869 .I35 v.7 (2004)Item locationOff-site

IEEE Autotestcon proceedings.

Text

[New York, N.Y.] : Institute of Electrical and Electronics Engineers, ©1997-

1997-present

7 items

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FormatTextCall numberTJ213 .A8411 2003Item locationOff-site
FormatCall numberItem location
FormatTextCall numberTJ213 .A8411 2002Item locationOff-site
FormatCall numberItem location
FormatTextCall numberTJ213 .A8411 2001Item locationOff-site

Autotestcon.

Text

[New York, N.Y.] : [Institute of Electrical and Electronics Engineers], [1976-1983], [©1976]-1983.

1976-1983

8 items

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FormatTextCall numberTJ213 .A84 1983Item locationOff-site
FormatCall numberItem location
FormatTextCall numberTJ213 .A84 1982Item locationOff-site
FormatCall numberItem location
FormatTextCall numberTJ213 .A84 1981Item locationOff-site

Conference proceedings / IEEE Instrumentation/Measurement Technology Conference.

Text

[New York, N.Y.] : IEEE, [1994]-©1998.

1994-1998

10 items

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FormatTextCall numberTK7878 .I32951 1998 :v.1Item locationOff-site
FormatCall numberItem location
FormatTextCall numberTK7878 .I32951 1998 :v.2Item locationOff-site
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FormatTextCall numberTK7878 .I32951 1997 :v.1Item locationOff-site

Conference record / IEEE Instrumentation and Measurement Technology Conference.

Text

New York, N.Y. : IEEE, [1988-1993], ©1988-1993.

1988-1993

6 items

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FormatTextCall numberTK7878 .I32951 (1993)Item locationOff-site
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FormatTextCall numberTK7878 .I32951 (1992)Item locationOff-site
FormatCall numberItem location
FormatTextCall numberTK7878 .I32951 (1991)Item locationOff-site

Conference proceedings / IEEE Instrumentation and Measurement Technology Conference.

Text

New York, N.Y. : IEEE, [1987], ©1987.

1987-1987

1 item

FormatCall numberItem location
FormatTextCall numberTK7878 .I32951 (1987)Item locationOff-site

Conference record / IEEE Instrumentation and Measurement [Technology] Conference.

Text

New York, N.Y. : IEEE, [1986], ©1986.

1986-1986

1 item

FormatCall numberItem location
FormatTextCall numberTK7878 .I32951 (1986)Item locationOff-site

CPEM digest.

Text

New York [etc.] Institute of Electrical and Electronics Engineers [etc.]

19-present

16 items

FormatCall numberItem location
FormatTextCall numberQC670 .C58 2002Item locationOff-site
FormatCall numberItem location
FormatTextCall numberQC670 .C58 2000Item locationOff-site
FormatCall numberItem location
FormatTextCall numberQC670 .C58 1998Item locationOff-site

Proceedings / Autotestcon.

Text

New York, NY : Institute of Electrical and Electronics Engineers, [1984-1987], ©1984-1987.

1984-1987

4 items

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FormatTextCall numberTJ213 .A841 1984Item locationOff-site
FormatCall numberItem location
FormatTextCall numberTJ213 .A841 1985Item locationOff-site
FormatCall numberItem location
FormatTextCall numberTJ213 .A841 1986Item locationOff-site

Proceedings / IEEE Instrumentation and Measurement Technology Conference.

Text

[New York, N.Y.] : IEEE, 1984-1985.

1984-1985

2 items

FormatCall numberItem location
FormatTextCall numberTK7878 .I32951 (1984)Item locationOff-site
FormatCall numberItem location
FormatTextCall numberTK7878 .I32951 (1985)Item locationOff-site

Proceedings of the ... IEEE Instrumentation and Measurement Technology Conference / IMTC.

Text

[New York, N.Y.?] : IEEE, ©1999-

1999-present

13 items

FormatCall numberItem location
FormatTextCall numberTK7878 .I32951 2001 v.3Item locationOff-site
FormatCall numberItem location
FormatTextCall numberTK7878 .I32951 2000 v.3Item locationOff-site
FormatCall numberItem location
FormatTextCall numberTK7878 .I32951 1999 v.3Item locationOff-site

IEEE instrumentation & measurement magazine.

Text

New York, NY : Institute of Electrical and Electronics Engineers, c1998-

1998-present

1 item

FormatCall numberItem location
FormatTextCall numberTK7881 .I285 vol. 9 2006Item locationOff-site

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