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Displaying 4 of 4 results for author "Rasmussen, A. L."
Scanning system for measuring uniformity of laser detector response and laser beam dimensions [microform] / A.L. Rasmussen, W.E. Case, A.A. Sanders.
Text
Boulder, Colo. : U.S. Dept. of Commerce, National Institute of Standards and Technology ; [Springfield, VA : Order from National Technical Information Service, 1990]
1990
0 resources
Improved low-level silicon-avalanche-photodiode transfer standards at 1.064 micrometers / A.L. Rasmussen, P.A. Simpson, A.A. Sanders.
Text
[Washington, D.C.] : U.S. Dept. of Commerce, National Institute of Standards and Technology ; [Springfield, VA : Order from National Technical Information Service, 1989]
1989
0 resources
Improved low-level silicon-avalanche-photodiode transfer standards at 1.064 micrometers / A. L. Rasmussen; P. A. Simpson; A. A. Sanders.
Text
Gaithersburg, MD : U.S. Dept. of Commerce, National Institute of Standards and Technology, 1989.
1989
1 resource
Available online
https://purl.fdlp.gov/GPO/gpo100438Scanning system for measuring uniformity of laser detector response and laser beam dimensions / A. L. Rasmussen; W. E. Case; A. A. Sanders.
Text
Gaithersburg, MD : U.S. Dept. of Commerce, National Institute of Standards and Technology, 1990.
1990
1 resource
Available online
https://purl.fdlp.gov/GPO/gpo98900No results found from Digital Research Books Beta
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