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Uncertainty analysis of instrument calibration and application [microform] / John S. Tripp and Ping Tcheng.

Text

Hampton, Va. : National Aeronautics and Space Administration, Langley Research Center ; [Springfield, Va. : National Technical Information Service, distributor, 1999]

1999

0 resources

Cosmology of biased discrete symmetry breaking [microform] / Graciela B. Gelmini, Marcelo Gleiser, and Edward W. Kolb.

Text

Batavia, IL : Fermi National Accelerator Laboratory ; [Washington, DC : National Aeronautics and Space Administration ; Springfield, Va. : National Technical Information Service, distributor, 1988]

1988

0 resources

Adjustable bias column end joint assembly [microform] / inventor, Richard E. Walsom, Harold G. Bush.

Text

[Washington, DC : National Aeronautics and Space Administration ; Springfield, Va. : National Technical Information Service, distributor, 1994]

1994

0 resources

Extended linear ion trap frequency standard apparatus [microform] / inventor, John D. Prestage.

Text

[Washington, DC : National Aeronautics and Space Administration ; Springfield, Va. : National Technical Information Service, distributor, 1994]

1994

0 resources

International Space Station cathode life testing [microform] : ... contract NAS3-27186 / George C. Soulas and Timothy R. Sarver-Verhey.

Text

[Cleveland, Ohio] : National Aeronautics and Space Administration, Lewis Research Center ; [Springfield, VA : National Technical Information Service, distributor, 1997]

1997

0 resources

Fast risetime reverse bias pulse failures in SiC PN junction diodes [microform] / Philip G. Nuedeck, Christian Fazi, James D. Parsons.

Text

[Washington, DC] : National Aeronautics and Space Administration ; [Springfield, Va. : National Technical Information Service, distributor, 1996]

1996

0 resources

OARE STS-75 (USMP-3) final report [microform] : under contract NAS3-26556 / James E. Rice.

Text

[Washington, DC : National Aeronautics and Space Administration ; Springfield, Va. : National Technical Information Service, distributor, 1996]

1996

0 resources

Acoustic absorption characteristics of an orifice with a mean bias flow [microform] / K.K. Ahuja, R.J. Gaeta, and M.D'Agostino.

Text

Hampton, Va. : National Aeronautics and Space Administration, Langley Research Center ; Springfield, VA : National Technical Information Service, distributor, [2000]

2000

0 resources

Wind models for the NSTS ascent trajectory biasing for wind load alleviation [microform] / by O.E. Smith ... [et al.].

Text

[Marshall Space Flight Center, Ala.] : National Aeronautics and Space Administration, George C. Marshall Space Flight Center ; [Springfield, Va. : For sale by National Technical Information Service, 1989]

1989

1 resource

Available online

http://purl.access.gpo.gov/GPO/LPS92623

Estimation of bias errors in measured airplane responses using maximum likelihood method / Vladislav Klein, Dan R. Morgan.

Text

Hampton, Va. : National Aeronautics and Space Administration, Langley Research Center, [1987]

1987

1 resource

Estimation of bias errors in measured airplane responses using maximum likelihood method [microform] / Vladislav Klein, Dan R. Morgan.

Text

Hampton, Va. : National Aeronautics and Space Administration, Langley Research Center, [1987]

1987

1 resource

Adaptive control in the presence of simultaneous sensor bias and actuator failures / Suresh M. Joshi.

Text

Hampton, Va. : National Aeronautics and Space Administration, Langley Research Center, [2012]

2012

1 resource

Fast risetime reverse bias pulse failures in SiC PN junction diodes / Philip G. Nuedeck, Christian Faziz, James D. Parsons.

Text

Cleveland, Ohio : National Aeronautics and Space Administration, Lewis Research Center, June 1996.

1996-6

1 resource

Ice growth measurements from image data to support ice-crystal and mixed-phase accretion testing / Peter M. Struk, Christopher J. Lynch.

Text

Cleveland, Ohio : National Aeronautics and Space Administration, Glenn Research Center, 2012.

2012

1 resource

The end of bias : a beginning : the science and practice of overcoming unconscious bias / Jessica Nordell.

Text

New York, New York : Metropolitan Books, Henry Holt and Company, 2021.

2021-2021

0 resources

Cognitive illusions : intriguing phenomena in thinking, judgment and memory / edited by Rüdiger F. Pohl.

Text

London ; New York : Routledge, Taylor & Francis Group, 2017.

2017

1 item

FormatCall numberItem location
FormatTextCall numberBF323.E7 C64 2017Item locationOff-site
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The end of bias : a beginning : the science and practice of overcoming unconscious bias / Jessica Nordell.

Text

New York, New York : Metropolitan Books, Henry Holt and Company, 2021.

2021-2021

1 item

FormatCall numberItem location
FormatTextCall numberHM1091 .N67 2021Item locationOff-site
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The antibiotic tales / Sonny Liew, Hsu Li Yang.

Text

Singapore : Epigram, [2020]

2020-2020

1 item

FormatCall numberItem location
FormatTextCall numberRM267 .L54 2020gItem locationOff-site

Interpreting epidemiologic evidence : strategies for study design and analysis / David A. Savitz.

Text

New York : Oxford University Press, 2003.

2003

1 item

FormatCall numberItem location
FormatTextCall numberRA652.4 .S286 2003Item locationOff-site

Meta-analysis in medical research : the handbook for the understanding and practice of meta-analysis / Gioacchino Leandro.

Text

Malden, Mass. : BMJ books : Blackwell Pub., 2005.

2005

1 item

FormatCall numberItem location
FormatTextCall numberR853.M48 L43 2005Item locationOff-site

Bias in geographical education / edited by Ashley Kent.

Text

London : Department of Geography, University of London Institute of Education, c1982.

1982

1 item

FormatCall numberItem location
FormatTextCall numberG74 .B52 1982Item locationOff-site

Ecologia, epidemiologia e sociedade / Oswald Paulo Forattini.

Text

[São Paulo] : EDUSP : Artes Médicas, 1992.

1992

1 item

FormatCall numberItem location
FormatTextCall numberQH541 .F677 1992xItem locationOff-site

Differential item functioning / Steven J. Osterlind, Howard T. Everson.

Text

Thousand Oaks, Calif. : SAGE, c2009.

2009

1 item

FormatCall numberItem location
FormatTextCall numberHA29 .O79 2009Item locationOff-site

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