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Transparent conducting thin films for spacecraft applications [microform] / Maria E. Perez-Davis ... [et al].

Text

[Washington, DC : National Aeronautics and Space Administration ; Springfield, Va. : National Technical Information Service, distributor, 1994?]

1994

0 resources

Measurement of carrier transport and recombination parameter in heavily doped silicon [microform] : final report.

Text

Stanford, CA : Solid State Electronics Laboratory, Stanford Electronics Laboratories, Dept. of Electrical Engineering, Stanford University ; [Washington, D.C. : National Aeronautics and Space Administration ; Springfield, Va. : National Technical Information Service, distributor, 1986-

1986-present

0 resources

Electrical characterization of 6H crystalline silicon carbide [microform] / Stephen E. Lempner.

Text

[Washington, D.C. : National Aeronautics and Space Administration ; Springfield, Va. : National Technical Information Service, distributor, 1994]

1994

0 resources

Parameter extraction and transistor models [microform] : final report ... / by Charles Rykken ... [et al.].

Text

[Claremont, Calif.] : Mathematics Clinic, Claremont Graduate School ; [Pasadena, Calif.] : Jet Propulsion Laboratory, California Institute of Technology ; [Springfield, Va. : National Technical Information Service, distributor, 1987]

1987

0 resources

Characterization of the transport properties of channel delta-doped structures by light-modulated Shubnikov-de Haas measurements [microform] / R.A. Mena ... [et al.].

Text

[Washington, D.C.] : National Aeronautics and Space Administration ; [Springfield, Va. : National Technical Information Service, distributor, 1995]

1995

0 resources

Mixed carrier conduction in modulation-doped field effect transistors [microform] / S.E. Schacham ... [et al.].

Text

[Washington, D.C. : National Aeronautics and Space Administration ; Springfield, Va. : National Technical Information Service, distributor, 1995]

1995

0 resources

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