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Transparent conducting thin films for spacecraft applications [microform] / Maria E. Perez-Davis ... [et al].
Text
[Washington, DC : National Aeronautics and Space Administration ; Springfield, Va. : National Technical Information Service, distributor, 1994?]
1994
0 resources
Measurement of carrier transport and recombination parameter in heavily doped silicon [microform] : final report.
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Stanford, CA : Solid State Electronics Laboratory, Stanford Electronics Laboratories, Dept. of Electrical Engineering, Stanford University ; [Washington, D.C. : National Aeronautics and Space Administration ; Springfield, Va. : National Technical Information Service, distributor, 1986-
1986-present
0 resources
Electrical characterization of 6H crystalline silicon carbide [microform] / Stephen E. Lempner.
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[Washington, D.C. : National Aeronautics and Space Administration ; Springfield, Va. : National Technical Information Service, distributor, 1994]
1994
0 resources
Parameter extraction and transistor models [microform] : final report ... / by Charles Rykken ... [et al.].
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[Claremont, Calif.] : Mathematics Clinic, Claremont Graduate School ; [Pasadena, Calif.] : Jet Propulsion Laboratory, California Institute of Technology ; [Springfield, Va. : National Technical Information Service, distributor, 1987]
1987
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Characterization of the transport properties of channel delta-doped structures by light-modulated Shubnikov-de Haas measurements [microform] / R.A. Mena ... [et al.].
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[Washington, D.C.] : National Aeronautics and Space Administration ; [Springfield, Va. : National Technical Information Service, distributor, 1995]
1995
0 resources
Mixed carrier conduction in modulation-doped field effect transistors [microform] / S.E. Schacham ... [et al.].
Text
[Washington, D.C. : National Aeronautics and Space Administration ; Springfield, Va. : National Technical Information Service, distributor, 1995]
1995
0 resources