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The optical transfer function [by] K. R. Barnes. With a pref. by W. D. Wright.
Text
New York, American Elsevier Pub. Co. [1971]
1971
1 item
| Format | Call number | Item location |
|---|---|---|
| FormatText | Call numberJSF 72-336 | Item locationOffsite |
75 Jahre Abteilung für Optische Messinstrumente. 1893-1968. ([Hrsg.:] Carl Zeiss, Oberkochen, Württ. Für d. Inhalt verantwortl.: Harald Volkmann. Schriftl.: Herbert Gottschalk.)
Text
Aalen/Württ., Theiss (1968).
1968
1 item
| Format | Call number | Item location |
|---|---|---|
| FormatText | Call numberJSG 72-138 | Item locationOffsite |
Optical transforms [edited by] H. Lipson.
Text
London, New York, Academic Press, 1972.
1972
1 item
| Format | Call number | Item location |
|---|---|---|
| FormatText | Call numberJSE 73-355 | Item locationOffsite |
Optical instruments and technique 1969: proceedings of the conference held at the University of Reading during 14th-19th July, 1969, under the auspices of the International Commission for Optics and arranged by the Optical Sub-Committee of the British National Committee for Physics; edited by Home Dickson.
Text
Newcastle-upon-Tyne, Oriel P., 1970.
1970
1 item
| Format | Call number | Item location |
|---|---|---|
| FormatText | Call numberJSE 73-659 | Item locationOffsite |
Optische Distanzmessung: Doppelbild oder Distanzfäden. [Von] J[ohannes] C[ornelius] O[be] van Gijsen. With a summary: Optical measurement: double-image or stadia haris. Met een samenvatting: Optische afstandmeting: dubbelbeeld of afstandsraden.
Text
Wageningen, Centrum voor Landbouwpublikaties en Landbouwdocumentatie: ['s Gravenh., Staatsuitgeverij] 1969.
1969
1 item
| Format | Call number | Item location |
|---|---|---|
| FormatText | Call numberJSE 74-572 | Item locationOffsite |
Optical methods in ultrancentrifugation, electrophoresis, and diffusion; with a guide to the interpretation of records, by Peter H. Lloyd.
Text
Oxford, Clarendon Press, 1974.
1974
1 item
| Format | Call number | Item location |
|---|---|---|
| FormatText | Call numberJSE 74-1740 | Item locationOffsite |
Měření a vytváření tenkých vrstev v optice.
Text
Praha, Nakl. Československé akademie věd, 1957.
1957
1 item
| Format | Call number | Item location |
|---|---|---|
| FormatText | Call numberXLS-6 Sv. 4, Sv. 11, Sv. 14 | Item locationOffsite |
Optical shop testing / edited by Daniel Malacara.
Text
New York : Wiley, c1978.
1978
1 item
| Format | Call number | Item location |
|---|---|---|
| FormatText | Call numberJSE 78-1332 | Item locationOffsite |
Proceedings of the ICO Conference on Optical Methods in Scientific and Industrial Measurements, Tokyo, 26-30 August 1974. Edited by Shun-ichi Tanaka.
Text
Tokyo, Japanese Journal of Applied Physics, 1975.
1975
1 item
| Format | Call number | Item location |
|---|---|---|
| FormatText | Call numberJSF 78-765 | Item locationOffsite |
Optical radiation measurements.
Text
New York, Academic Press, 1979-
1979-present
5 items
| Format | Call number | Item location |
|---|---|---|
| FormatText | Call numberJSP 80-270 v. 5 | Item locationOffsite |
| Format | Call number | Item location |
|---|---|---|
| FormatText | Call numberJSP 80-270 v. 4 | Item locationOffsite |
| Format | Call number | Item location |
|---|---|---|
| FormatText | Call numberJSP 80-270 v. 3 | Item locationOffsite |
Measurement of suspended particles by quasi-elastic light scattering / edited by Barton E. Dahneke.
Text
New York : Wiley, c1983.
1983
1 item
| Format | Call number | Item location |
|---|---|---|
| FormatText | Call numberJSE 85-446 | Item locationOffsite |
Optical measurements in fluid mechanics 1985 : proceedings of the VI International Conference on Photon Correlation and Other Techniques in Fluid Mechanics held in Churchill College, Cambridge, 10-12 July 1985 / edited by P.H. Richards.
Text
Bristol, England ; Boston : A. Hilger, c1985.
1985
1 item
| Format | Call number | Item location |
|---|---|---|
| FormatText | Call numberJSK 77-69 no. 77 v. 77 (1985) | Item locationOffsite |
Proceedings of the Inspection, Measurement and Control and Laser Diagnostics and Photochemistry, ICALEO '84 / editors, Donald Sweeney Robert Lucht ; organized in cooperation with ... The American Ceramic Society ... [et al.]
Text
Toledo, OH : LIA-Laser Institute of America, 1985.
1985
1 item
| Format | Call number | Item location |
|---|---|---|
| FormatText | Call numberJSF 86-969 | Item locationOffsite |
Fast electrical and optical measurements / edited by James E. Thompson, Lawrence H. Luessen ; editorial committee, Anthony K. Hyder ... [et al.].
Text
Dordrecht ; Boston : Martinus Nijhoff, 1986.
1986
2 items
| Format | Call number | Item location |
|---|---|---|
| FormatText | Call numberJSE 86-1685 v. 2 | Item locationOffsite |
| Format | Call number | Item location |
|---|---|---|
| FormatText | Call numberJSE 86-1685 v. 1 | Item locationOffsite |
Optical metrology / Kjell J. Gåsvik.
Text
Chichester[West Sussex] ; New York : Wiley, c1987.
1987
1 item
| Format | Call number | Item location |
|---|---|---|
| FormatText | Call numberJSE 87-2717 | Item locationOffsite |
Optical sensing techniques and signal processing / Tudor E. Jenkins.
Text
Englewood Cliffs, NJ : Prentice-Hall, c1987.
1987
1 item
| Format | Call number | Item location |
|---|---|---|
| FormatText | Call numberJSE 88-2583 | Item locationOffsite |
Optical metrology : coherent and incoherent optics for metrology, sensing and control in science, industry, and biomedicine / edited by Olivério D.D. Soares.
Text
Dordrecht ; Boston : M. Nijhoff, 1987.
1987
1 item
| Format | Call number | Item location |
|---|---|---|
| FormatText | Call numberJSE 87-1606 | Item locationOffsite |
Physical optics and light measurements / edited by Daniel Malacara.
Text
Boston : Academic Press, c1988.
1988
1 item
| Format | Call number | Item location |
|---|---|---|
| FormatText | Call numberJSE 88-1034 | Item locationOffsite |
Introduction to the optical transfer function / Charles S. Williams and Orville A. Becklund.
Text
New York : Wiley, c1989.
1989
1 item
| Format | Call number | Item location |
|---|---|---|
| FormatText | Call numberJSE 89-812 | Item locationOffsite |
The physics of moire metrology / Oded Kafri, Ilana Glatt.
Text
New York : Wiley, c1990.
1990
1 item
| Format | Call number | Item location |
|---|---|---|
| FormatText | Call numberJSE 91-452 | Item locationOffsite |
Optical 3-D measurement techniques : applications in inspection, quality control, and robotics : papers presented to the conference organized at Vienna, Austria, September 18-20, 1989 / [edited by] A. Gruen, H. Kahmen.
Text
Karlsruhe : Wichmann, c1989.
1989
1 item
| Format | Call number | Item location |
|---|---|---|
| FormatText | Call numberJSD 91-233 | Item locationOffsite |
Formation and control of optical wavefronts / edited by P.P. Pashinin ; translated by Kevin S. Hendzel.
Text
Commack, NY : Nova Science Publishers, c1989.
1989
1 item
| Format | Call number | Item location |
|---|---|---|
| FormatText | Call numberJSE 92-480 | Item locationOffsite |
Optical components, systems, and measurement techniques / Rajpal S. Sirohi, Mahendra P. Kothiyal.
Text
New York : M. Dekker, c1991.
1990
1 item
| Format | Call number | Item location |
|---|---|---|
| FormatText | Call numberJSE 92-933 | Item locationOffsite |
Optical measurements in the printing industry [by] J.M. Adams.
Text
Oxford, New York, Pergamon Press [1965]
1965
1 item
| Format | Call number | Item location |
|---|---|---|
| FormatText | Call numberPEO (Adams, J. M. Optical measurements in the printing industry) 1965 | Item locationOffsite |
Colorimétrie.
Text
Paris, Editions de la Revue d'Optique théorique et instrumentale, 1951.
1951
1 item
| Format | Call number | Item location |
|---|---|---|
| FormatText | Call numberPEO (Blottiau, F. Colorimetrie) 1951 | Item locationOffsite |
Einführung in die Messung der optischen Grundgrössen.
Text
Karlsruhe, G. Braun, 1954.
1954
1 item
| Format | Call number | Item location |
|---|---|---|
| FormatText | Call numberPEO (Flugge, J. Einfuhrung in die Messung der optischen Grundgrossen) 1954 | Item locationOffsite |
Engineering optics; the principles of optical methods in engineering measurement, by K. J. Habell and Arthur Cox.
Text
London, I. Pitman, 1948.
1948
1 item
| Format | Call number | Item location |
|---|---|---|
| FormatText | Call numberPEB (Habell, K. J. Engineering optics) 1948 | Item locationOffsite |
Outlines of applied optics, by P. G. Nutting ... with 73 illustrations.
Text
Philadelphia, P. Blakiston's son & co., 1912.
1912
1 item
| Format | Call number | Item location |
|---|---|---|
| FormatText | Call numberPED (Nutting, P. G. Outlines of applied optics) 1912 | Item locationOffsite |
Die optische Werkstatt; handbuch der arbeitsverfahren und Prüfmethoden für die Fertigung von Optik, von Dr. Waldemar Ewald. Unter Mitarbeit von Dr. Hans Schulz und Dr. Franz Weidert mit 169 Textabbildungen und 3 Interpolationstafeln.
Text
Berlin, Gebrüder Borntraeger, 1930.
1930
1 item
| Format | Call number | Item location |
|---|---|---|
| FormatText | Call numberPEH (Ewald, W. Optische Werkstatt) 1930 | Item locationOffsite |
Optik in der Längenmesstechnik.
Text
Berlin, Verlag Technik (1966)
1966
1 item
| Format | Call number | Item location |
|---|---|---|
| FormatText | Call numberPEH (Hodam, F. Optik in der Langenmesstechnik. 1966) 1966 | Item locationOffsite |
Optics in metrology; [colloquium] 6-9 May 1958, edited by Pol Mollet.
Text
Oxford, New York, Pergamon Press, 1960.
1960
1 item
| Format | Call number | Item location |
|---|---|---|
| FormatText | Call numberPEH (International Commission on Optics. Optics in metrology) 1960 | Item locationOffsite |
Mess- und Prüfmethoden der optischen Fertigung.
Text
Berlin, Akademie-Verlag, 1953-
1953-present
1 item
| Format | Call number | Item location |
|---|---|---|
| FormatText | Call numberPEH (Picht, J. Mess- und Prufmethoden der optischen Fertigung) Library has: Bd.1 1953 | Item locationOffsite |
Anleitung zu optischen untersuchungen mit dem polarisa-tionsmikroskop, von F. Rinne und M. Berek. Mit 335 abbildungen im text und einem bildnis von F. Rinne.
Text
Leipzig, Dr. Max Janecke, 1934.
1934
1 item
| Format | Call number | Item location |
|---|---|---|
| FormatText | Call numberPWX (Rinne, F. Anleitung zu optischen untersuchungen mit dem polarisa-tionsmikroskop) | Item locationOffsite |
Anleitung zu optischen Untersuchungen mit dem Polarisa tionsmikroskop, Aufl. von Max. Berek. Hrsg. von C.H. Claussen, A. Driesen und S. Rösch.
Text
Stuttgart, E. Schweizerbart, 1953.
1953
1 item
| Format | Call number | Item location |
|---|---|---|
| FormatText | Call numberPWX (Rinne, F. Anleitung zu optischen Untersuchungen mit dem Polarisationsmikroskop) | Item locationOffsite |
Engineering precision measurements.
Text
London : Chapman and Hall, 1944.
1944
1 item
| Format | Call number | Item location |
|---|---|---|
| FormatText | Call numberVBDN (Judge, A. W. Engineering precision measurements) | Item locationOffsite |
Engineering precision measurements.
Text
London, Chapman & Hall, 1957.
1957
1 item
| Format | Call number | Item location |
|---|---|---|
| FormatText | Call numberVBDN (Judge, A. W. Engineering precision measurements) | Item locationOffsite |
Interferogram analysis for optical testing / Daniel Malacara, Manuel Servín, Zacarias Malacara.
Text
New York : Marcel Dekker, c1998.
1998
1 item
| Format | Call number | Item location |
|---|---|---|
| FormatText | Call numberJSE 98-1189 | Item locationOffsite |
Optical methods of measurement : wholefield techiques / Rajpal S. Sirohi, Fook Siong Chau.
Text
New York : Marcel Dekker, c1999.
1999
1 item
| Format | Call number | Item location |
|---|---|---|
| FormatText | Call numberJSE 99-1491 | Item locationOffsite |
Adaptive optics engineering handbook / edited by Robert K. Tyson.
Text
New York : Marcel Dekker, c2000.
2000
1 item
| Format | Call number | Item location |
|---|---|---|
| FormatText | Call numberJSE 00-700 | Item locationOffsite |
Concentrator testing using projected images [microform] / Kent S. Jefferies.
Text
[Washington, DC] : National Aeronautics and Space Administration ; [Springfield, Va. : For sale by the National Technical Information Service, 1991]
1991
0 resources
Research and development of optical measurement techniques for aerospace propulsion research [microform] : a NASA Lewis Research Center perspective / Daniel J. Lesco.
Text
[Washington, DC] : National Aeronautics and Space Administration ; [Springfield, Va. : For sale by the National Technical Information Service, 1992]
1991
0 resources
Antireflecting-chromium linewidth standard, SRM 475, for calibration of optical microscope linewidth measuring systems [microform] / Carol F. Vezzetti, Ruth N. Varner, James E. Potzick.
Text
Gaithersburg, MD : U.S. Dept. of Commerce, National Institute of Standards and Technology ; [Springfield, VA : Order from National Technical Information Service], 1992.
1992
0 resources
Advanced smoke meters for jet engine exhaust measurement [microform] / prepared by Robert W. Pitz.
Text
[Washington, D.C.] : National Aeronautics and Space Administration ; [Springfield, Va. : For sale by the National Technical Information Service, 1986]
1986
0 resources
Precision spectroscopy, diode lasers, and optical frequency measurement technology [microform] : selected publications of the Optical Frequency Measurement Group of the Time and Frequency Division / edited by Leo Hollberg ... [et al.].
Text
Boulder, Colo. : U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology ; Washington, DC : For sale by the Supt. of Docs., U.S. G.P.O., 1998.
1998
0 resources
Opti̊ceskie izmereni︠i︡a. [Ůcebnik dl︠i︡a vuzov po spe̜tialwnosti "Opti̊c. pribory i spektroskopi︠i︡a." Izd. 2-e].
Text
Moskva, "Nedra," 1968.
1968
1 item
| Format | Call number | Item location |
|---|---|---|
| FormatText | Call number*QH 77-1543 | Item locationOffsite |
Optical metrology / Kjell J. Gåsvik.
Text
West Sussex, Eng. ; Hoboken, N.J. : J. Wiley & Sons, c2002.
2002
1 item
Available online
Table of contents| Format | Call number | Item location |
|---|---|---|
| FormatText | Call numberJBF 03-951 | Item locationOffsite |
Optical sensing and measurement : proceedings of the 7th International Congress on Applications of Lasers and Electrooptics ICALEO '88, 30 October-4 November, 1988, Santa Clara, CA, USA / Aaron D. Gara (editor).
Text
Berlin ; New York : Springer-Verlag ; UK : IFS Publications Ltd., c1989.
1989
1 item
| Format | Call number | Item location |
|---|---|---|
| FormatText | Call numberJSF 95-131 | Item locationOffsite |
Characterization of luminance probe for accurate contrast measurements in medical displays [microform] / Edward F. Kelley, Aldo Badano.
Text
Gaithersburg, Md. : U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, [2003]
2003
0 resources
Interferometric metrology of photomask blanks [microform] : approaches using 633 nm wavelength / C.J. Evans ... [et al.].
Text
Gaithersburg, MD : U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, [2002]
2000
0 resources
Optical measurement of propeller blade deflections [microform] / Anatole P. Kurkov.
Text
[Washington, D.C.] : National Aeronautics and Space Administration, Scientific and Technical Information Branch ; Springfield, Va. : For sale by the National Technical Information Service, 1988.
1988
0 resources
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