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X-ray diffraction imaging (topography) of electrooptic crystals by synchrotron radiation [microform] / Bruce Steiner ... [et al.].
Text
[Washington, DC : National Aeronautics and Space Administration ; Springfield, Va. : National Technical Information Service, distributor, 1988]
1988
0 resources
Diffraction imaging (topography) with monochromatic synchrotron radiation [microform] / Bruce Steiner ... [et al.].
Text
[Washington, DC : National Aeronautics and Space Administration ; Springfield, Va. : National Technical Information Service, distributor, 1988]
1988
0 resources
Optical radiation measurements : The impact of radiometry and photometry and the role of NBS / Bruce Steiner.
Text
Gaithersburg, MD : U.S. Dept. of Commerce, National Institute of Standards and Technology, 1973.
1973
1 resource
Available online
https://purl.fdlp.gov/GPO/gpo101788Optical radiation measurements : The present state of radiometry and photometry / Bruce Steiner.
Text
Gaithersburg, MD : U.S. Dept. of Commerce, National Institute of Standards and Technology, 1974.
1974
1 resource
Available online
https://purl.fdlp.gov/GPO/gpo94959No results found from Digital Research Books Beta
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