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Automatic Testing '80 Conference proceedings : Palais des Congrès, Paris, France, 23, 24, 25 September, 1980.
Text
Buckingham, Buckshire : Network, d1980.
1980
1 item
| Format | Call number | Item location |
|---|---|---|
| FormatText | Call numberJSG 84-98 | Item locationOffsite |
Automated support systems.
Text
[New York, RCA Defense Electronic Products, 1968]
1968
1 item
| Format | Call number | Item location |
|---|---|---|
| FormatText | Call numberJSF 71-103 | Item locationOffsite |
Proceedings.
Text
St. Louis.
19-19
1 item
| Format | Call number | Item location |
|---|---|---|
| FormatText | Call numberJSP 74-254 1969-72 | Item locationOffsite |
Diagnostika neispravnosteĭ Ė︠T︡SVM.
Text
Minsk, Izd-vo BGU, 1972.
1972
1 item
| Format | Call number | Item location |
|---|---|---|
| FormatText | Call number*QH 73-4627 | Item locationOffsite |
Automatic testing: systems and applications / Roy Knowles.
Text
London ; New York : McGraw-Hill, c1976.
1976
1 item
| Format | Call number | Item location |
|---|---|---|
| FormatText | Call numberJSE 76-946 | Item locationOffsite |
Automatic testing / edited by N. O. Matthews.
Text
[Newport Pagnell : Network, 1975]
1975
1 item
| Format | Call number | Item location |
|---|---|---|
| FormatText | Call numberJSD 78-229 | Item locationOffsite |
Rational fault analysis / edited by Richard Saeks, Stanley R. Liberty.
Text
New York : M. Dekker, c1977.
1977
1 item
| Format | Call number | Item location |
|---|---|---|
| FormatText | Call numberJSE 78-1405 | Item locationOffsite |
Autotestcon.
Text
[New York].
28 items
| Format | Call number | Item location |
|---|---|---|
| FormatText | Call numberJSP 78-389 2005 | Item locationOffsite |
| Format | Call number | Item location |
|---|---|---|
| FormatText | Call numberJSP 78-389 2004 | Item locationOffsite |
| Format | Call number | Item location |
|---|---|---|
| FormatText | Call numberJSP 78-389 2003 | Item locationOffsite |
Error detecting codes, self-checking circuits and applications / John Wakerly.
Text
New York : North-Holland, c1978.
1978
1 item
| Format | Call number | Item location |
|---|---|---|
| FormatText | Call numberJSE 79-539 | Item locationOffsite |
Automatic testing and evaluation of digital integrated circuits / James T. Healy.
Text
Reston, Va. : Reston Pub. Co., c1981.
1981
1 item
| Format | Call number | Item location |
|---|---|---|
| FormatText | Call numberJSE 81-1084 | Item locationOffsite |
IEEE guide to the use of ATLAS / sponsor, IEEE ATLAS Committee of the IEEE Standards Board.
Text
New York, N.Y. : Institute of Electrical and Electronics Engineers : [distributed in cooperation with Wiley-Interscience, c1980]
1980
1 item
| Format | Call number | Item location |
|---|---|---|
| FormatText | Call numberJSF 81-143 | Item locationOffsite |
Konferenzuntlerlagen =: Conference proceedings / Automatic Testing & Test and Measurement '81 ... Wiesbaden 23, 24, 25, 26 März 1981.
Text
Printers Mews, Market Hill, Buckingham, Bucks., Eng. : Network, c1981.
1981
2 items
| Format | Call number | Item location |
|---|---|---|
| FormatText | Call numberJSG 82-15 v. 3-4 | Item locationOffsite |
| Format | Call number | Item location |
|---|---|---|
| FormatText | Call numberJSG 82-15 | Item locationOffsite |
Failure diagnosis and performance monitoring / L.F. Pau.
Text
New York : M. Dekker, c1981.
1981
1 item
| Format | Call number | Item location |
|---|---|---|
| FormatText | Call numberJSE 81-1216 | Item locationOffsite |
Computer controlled testing and instrumentation : an introduction to the IEC-625:IEEE-488 bus / Martin Colloms.
Text
New York : Wiley, c1983.
1983
1 item
| Format | Call number | Item location |
|---|---|---|
| FormatText | Call numberJSD 85-383 | Item locationOffsite |
LSI & boards : digest of papers, 1979 Test Conference, October 23, 24 & 25, 1979, held at Cherry Hill, New Jersey / sponsored by IEEE Computer Society, Test Technology Committee, and the Philadelphia Section of the IEEE.
Text
New York, N.Y. : Institute of Electrical and Electronics Engineers ; Long Beach, Calif. : available from IEEE Computer Society Publications Office, c1979.
1979
1 item
| Format | Call number | Item location |
|---|---|---|
| FormatText | Call numberJSF 83-273 | Item locationOffsite |
Testing's changing role : International Test Conference, 1983 : proceedings, October 18-20, 1983 / sponsored by the IEEE Computer Society, Test Technology Committee, IEEE Philadelphia Section.
Text
Silver Spring, MD : IEEE Computer Society Press, 1983.
1983
1 item
| Format | Call number | Item location |
|---|---|---|
| FormatText | Call numberJSF 84-138 | Item locationOffsite |
Testing in the 1980's : digest of papers, 1981 International Test Conference, October 27, 28 & 29, 1981 / sponsored by the IEEE Computer Society, Test Technology Committee, and the Philadelphia Section of the IEEE.
Text
Los Angeles, CA (P.O. Box 80452, Los Angeles 90080) : The Society, c1981.
1981
1 item
| Format | Call number | Item location |
|---|---|---|
| FormatText | Call numberJSF 83-572 | Item locationOffsite |
Conference record, 1982 Workshop on Industrial Applications of Machine Vision, May 3-5, 1982, Research Triangle Park, N.C.
Text
Los Angeles, CA : Available from IEEE Computer Society ; Piscataway, N.J. : IEEE Service Center [distributor] ; Silver Spring, MD : Published by IEEE Computer Society Press, 1982.
1982
1 item
| Format | Call number | Item location |
|---|---|---|
| FormatText | Call numberJSF 83-684 | Item locationOffsite |
Curriculum for test technology : M.E.I.S. Center, University of Minnesota, Minneapolis, 1983, November 16-17, 1983.
Text
Silver Spring, MD : IEEE Computer Society Press, c1983.
1983
1 item
| Format | Call number | Item location |
|---|---|---|
| FormatText | Call numberJSF 84-137 | Item locationOffsite |
Testing for space and weapon products : all-day symposium, Tuesday, 18 January 1983, presented at the Royal Aeronautical Society / [sponsored by] Astronautics & Guided Flight Section.
Text
London : The Society, [1983]
1983
1 item
| Format | Call number | Item location |
|---|---|---|
| FormatText | Call numberJSG 84-120 | Item locationOffsite |
ATE Seminar/Exhibit : automated testing for electronics manufacturing : proceedings : June 8-11, 1981, John B. Hynes Veterans Auditorium, Boston, MA / organized and produced by Benwill Publishing Corporation.
Text
Boston, MA (1050 Commonwealth Ave., Boston 02215) : The Corp., c1981.
1981
1 item
| Format | Call number | Item location |
|---|---|---|
| FormatText | Call numberJSF 84-613 | Item locationOffsite |
IEEE ATPG workshop proceedings / Automatic Test Program Generation Workshop.
Text
Silver Spring, MD : IEEE Computer Society Press
unknown-present
1 item
| Format | Call number | Item location |
|---|---|---|
| FormatText | Call numberJSP 83-217 (1983) | Item locationOffsite |
Automatic Testing 81 & Test Instrumentation : proceedings / [conference committee chairmen, R. Knowles, W. Barker ; committee, W. Bean ... et al.].
Text
Buckingham, Bucks. : Network, c1981.
1981
2 items
| Format | Call number | Item location |
|---|---|---|
| FormatText | Call numberJSG 84-147 V. 4-7 (INC.) | Item locationOffsite |
| Format | Call number | Item location |
|---|---|---|
| FormatText | Call numberJSG 84-147 | Item locationOffsite |
ATE : automatic test equipment / Allan C. Stover.
Text
New York : McGraw-Hill Book Co., c1984.
1984
1 item
| Format | Call number | Item location |
|---|---|---|
| FormatText | Call numberJSE 85-609 | Item locationOffsite |
The three faces of test : design, characterization, production : International Test Conference, 1984 : proceedings, October 16, 17, 18, 1984 / sponsored by the IEEE Computer Society, Test Technology Committee, IEEE Philadelphia Section.
Text
Silver Spring, MD : IEEE Computer Society Press ; Los Angeles, CA : Order from IEEE Computer Society, c1984.
1984
1 item
| Format | Call number | Item location |
|---|---|---|
| FormatText | Call numberJSF 85-139 | Item locationOffsite |
Interfacing test circuits with single-board computers / by Robert H. Luetzow.
Text
Blue Ridge Summit, Pa. : Tab Books, c1983.
1983
1 item
| Format | Call number | Item location |
|---|---|---|
| FormatText | Call numberJSE 85-1591 | Item locationOffsite |
Competent expert systems : a case study in fault diagnosis / E.T. Keravnou & L. Johnson.
Text
London : K. Page, 1986.
1986
1 item
| Format | Call number | Item location |
|---|---|---|
| FormatText | Call numberJSD 88-888 | Item locationOffsite |
Proceedings IEEE 1985 Workshop on Simulation & Test Generation Environments : September 17 & 18, 1985, San Francisco, California ; sponsors / IEEE Computer Society [and] Test Technology Committee.
Text
Washington, D.C. : IEEE Computer Society Press ; Los Angeles, CA : Order from IEEE Computer Society, c1986.
1986
1 item
| Format | Call number | Item location |
|---|---|---|
| FormatText | Call numberJSF 86-900 | Item locationOffsite |
Competent expert systems : a case study in fault diagnosis / E.T. Keravnou & L. Johnson.
Text
New York : MacGraw-Hill, 1986.
1986
1 item
| Format | Call number | Item location |
|---|---|---|
| FormatText | Call numberJSE 88-1457 | Item locationOffsite |
Computer integrated testing / edited by Allen Buckroyd.
Text
New York : Wiley, 1989.
1989
1 item
| Format | Call number | Item location |
|---|---|---|
| FormatText | Call numberJSE 90-766 | Item locationOffsite |
Neural models and algorithms for digital testing / by Srimat T. Chakradhar, Vishwani D. Agrawal, Michael L. Bushnell.
Text
Boston : Kluwer Academic Publishers, c1991.
1991
1 item
| Format | Call number | Item location |
|---|---|---|
| FormatText | Call numberJSE 91-1956 | Item locationOffsite |
Temporally distributed symptoms in technical diagnosis / K. N"okel.
Text
Berlin ; New York : Springer-Verlag, c1991.
1991
1 item
| Format | Call number | Item location |
|---|---|---|
| FormatText | Call numberJSF 91-964 | Item locationOffsite |
Test & measurement world.
Text
Boston, MA : Interfield Pub. Co., c1981-
1981-present
29 items
| Format | Call number | Item location |
|---|---|---|
| FormatPRINT | Call numberJSP 92-130 | Item locationSchwarzman Building - Main Reading Room 315 |
Available - Can be used on site. Please visit New York Public Library - Schwarzman Building to submit a request in person.
| Format | Call number | Item location |
|---|---|---|
| FormatPRINT | Call numberJSP 92-130 | Item locationSchwarzman Building - Main Reading Room 315 |
Available - Can be used on site. Please visit New York Public Library - Schwarzman Building to submit a request in person.
| Format | Call number | Item location |
|---|---|---|
| FormatPRINT | Call numberJSP 92-130 | Item locationSchwarzman Building - Main Reading Room 315 |
Available - Can be used on site. Please visit New York Public Library - Schwarzman Building to submit a request in person.
Automatic test equipment / Keith Brindley.
Text
Oxford ; Boston : Newnes, 1991.
1991
1 item
| Format | Call number | Item location |
|---|---|---|
| FormatText | Call numberJSE 92-1069 | Item locationOffsite |
Proceedings, International Test Conference, 1992.
Text
Altoona, PA : International Test Conference ; Piscataway, NJ : Additional copies can be ordered from IEEE Service Center, c1992.
1992
1 item
| Format | Call number | Item location |
|---|---|---|
| FormatText | Call numberJSF 93-96 | Item locationOffsite |
Proceedings, International Test Conference, 1993.
Text
Altoona, PA : International Test Conference ; Piscataway, NJ : additional copies can be ordered from IEEE Service Center, c1993.
1993
1 item
| Format | Call number | Item location |
|---|---|---|
| FormatText | Call numberJSF 94-128 | Item locationOffsite |
Automation in electronic test equipment. Edited by David M. Goodman.
Text
[New York, Distributed by New York University Press] 1966-69.
1966-1969
7 items
| Format | Call number | Item location |
|---|---|---|
| FormatText | Call numberTTE (Goodman, D. M. Automation in electronic test equipment) v. 7 | Item locationOffsite |
| Format | Call number | Item location |
|---|---|---|
| FormatText | Call numberTTE (Goodman, D. M. Automation in electronic test equipment) v. 6 | Item locationOffsite |
| Format | Call number | Item location |
|---|---|---|
| FormatText | Call numberTTE (Goodman, D. M. Automation in electronic test equipment) v. 5 | Item locationOffsite |
Design-for-test for digital IC's and embedded core systems / Alfred L. Crouch.
Text
Upper Saddle River, NJ : Prentice Hall PTR, c1999.
1999
2 items
| Format | Call number | Item location |
|---|---|---|
| FormatText | Call numberJSE 00-23 (Main work) | Item locationOffsite |
| Format | Call number | Item location |
|---|---|---|
| FormatText | Call number*WSC-3089 | Item locationOffsite |
Final report submitted to National Aeronautics and Space Administration, George C. Marshall Space Flight Center ... entitled Study of eddy current probes [microform] / by Gary L. Workman and Morgan Wang.
Text
Huntsville, Ala. : Materials Processing Laboratory, Center for Automation & Robotics, University of Alabama in Huntsville ; [Washington, D.C. : National Aeronautics and Space Administration ; Springfield, Va. : National Technical Information Service, distributor, 1992]
1992
0 resources
Millenium modem/channelizer special test equipment [microform] / William D. Ivancic.
Text
[Washington, DC] : National Aeronautics and Space Administration ; [Springfield, Va. : National Technical Information Service, distributor, 1995]
1995
0 resources
Applying independent verification and validation to automatic test equipment [microform] / by Cynthia C. Calhoun.
Text
[Washington, DC : National Aeronautics and Space Administration ; Springfield, Va. : National Technical Information Service, distributor, 1997]
1997
0 resources
Automated equipment repair series [microform] : educational resources for the machine tool industry : course syllabi : instructor's handbook, student laboratory manual / MASTER, a consortium of educators and industry.
Text
[Washington, DC] : U.S. Dept. of Education, Office of Educational Research and Improvement, Educational Resources Information Center, [1998]
1998
0 resources
A designer's guide to built-in self-test / Charles E. Stroud.
Text
Boston ; London : Kluwer Academic Publishers, c2002.
2002
1 item
| Format | Call number | Item location |
|---|---|---|
| FormatText | Call numberJSE 02-1091 | Item locationOffsite |
Multisensor instrumentation 6[sigma] design : defined accuracy computer-integrated measurement systems / Patrick H. Garrett.
Text
New York : J. Wiley, c2002.
2002
2 items
| Format | Call number | Item location |
|---|---|---|
| FormatText | Call numberJSF 03-637 [Text] | Item locationOffsite |
| Format | Call number | Item location |
|---|---|---|
| FormatText | Call number*WSE-3333 [Computer disk] | Item locationOffsite |
Automated testing of developmental satellite communications systems and subsystems [microform] / Kurt A. Shalkhauser and Robert J. Kerczewski.
Text
[Cleveland, Ohio : National Aeronautics and Space Administration, Lewis Research Center, 1985]
1985
0 resources
Conference record : the IEEE Systems Readiness Technology Conference, September 21-24, 1992, Dayton Convention Center, Dayton, Ohio / sponsored by the Institute of Electrical and Electronics Engineers ... [et al.].
Text
New York, NY : IEEE ; Piscataway, NJ : May be obtained from IEEE Service Center, c1992.
1992
0 resources
Proceedings, Autotestcon 93, September 20-23, 1993 : IEEE Systems Readiness Technology Conference, San Antonio Convention Center, San Antonio, Texas / sponsored by the Institute of Electrical and Electronics Engineers ... [et al.].
Text
Piscataway, NJ (445 Hoes Lane, Piscataway 08854) : May be ordered from Order Dept., IEEE, c1993.
1993
0 resources
Ground software maintenance facility (GSMF) user's manual [microform] : final, appendices.
Text
Huntsville, Ala. : TRW Defense Systems Group, Huntsville Operations ; [Washington, DC : National Aeronautics and Space Administration, 1986]
1986
0 resources
Test & measurement world [electronic resource].
Text
[Boston, MA] : [Interfield Pub. Co.], [©1981]-
1981-present
2 resources
Available online
View all available online resourcesTemporally distributed symptoms in technical diagnosis / K. N"okel.
Text
Berlin ; New York : Springer-Verlag, [1991], ©1991.
1991-1991
1 item
| Format | Call number | Item location |
|---|---|---|
| FormatText | Call numberTA169.6 .N65 1991g | Item locationOff-site |
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